Academic conference presentation
2014/03
Comparison of Channel Length Extracted from Gate Capacitance with That Extracted from Channel Resistance
(Proc. Int. Conf. on Microelectronic Test Structures)
2012/11
Difference in Threshold-Voltage Variability Caused by Measurement Method
(Proc. IEEE Workshop on Variability Modeling and Characterization at ICCAD)
2012/03
Threshold Voltage Variation Extracted from MOSFET C-V Curves by Charge-Based Capacitance Measurement
(Proc. Int. Conf. on Microelectronic Test Structures)
2011/04
Electrical Estimation of Channel Dopant Unifomity Using Test MOSFET Array
(Proc. Int. Conf. on Microelectronic Test Structures)
2011/04
Evaluation of MOSFET C-V Curve Variation Using Test Structure for Charge-Based Capacitance Measurement
(Proc. Int. Conf. on Microelectronic Test Structures)
2009/03
Measurement of MOSFET C-V Curve Variation Using CBCM Method
(Proc. Int. Conf. on Microelectronic Test Structures)
2008/03
Measurement of MOSFET Drain Current Variation Under High Gate Voltage
(Proc. Int. Conf. on Microelectronics Test Structure)