教員総覧 - 辻　勝弘 | 広島市立大学

ツジ　カツヒロ Tsuji Katsuhiro
辻　勝弘

所属

広島市立大学大学院情報科学研究科システム工学専攻

広島市立大学情報科学部システム工学科

職種助教

著書・論文歴
論文	Predictive Vehicle Driving Model Considering Modeling Errors of Center of Gravity, Azimuth Angle, and Sideslip Angle of The Kinematic Bicycle Model International Journal of Intelligent Transportation Systems Research (共著) 2025/12/29
論文	Study on effective MOSFET channel length extracted from gate capacitance Japanese J. Appl. Phys. 57,016601-1-016601-7頁 (共著) 2018/01/01
論文	Study on Threshold Voltage Evaluated by Charge-Based Capacitance Measurement IEICE TRANSACTIONS on Electronics VOL.E99-C (NO.4),466-473頁 (共著) 2016/04
論文	Development of Test Structure for Variability Evaluation Using Charge-Based Capacitance Measurement IEICE TRANSACTIONS on Electronics VOL.E97-C (NO.11),1117-1123頁 (共著) 2014/11/01
論文	Reconsideration of Effective Channel Length for Metal-Oxide-Semiconductor Field Effect Transistor Japanese Journal of Applied Physics Vol. 53,064303 (共著) 2014/05
論文	Measurement of Channel Length Variability Proc. IEEE Workshop on Variability Modeling and Characterization at ICCAD (共著) 2013/11
論文	Effect of Channel Dopant Distribution on Effective Channel Length Extraction Jpn. J. Appl. Phys. 52 (064301) (共著) 2013/06
論文	Effective Channel Length Estimation Using Charge-Based Capacitance Measurement Proc. Int. Conf. on Microelectronic Test Structures,59-63頁 (共著) 2013/03
論文	Reconsideration of the Threshold Voltage Variability Estimated with Pair Transistor Cell Array Proc. Int. Conf. on Microelectronic Test Structures,108-111頁 (共著) 2013/03
論文	Effect of Channel Dopant Non-uniformity on Transconductance Variability Japanese Journal of Applied Physics 51 (094301) (共著) 2012/08
論文	Effect of channel dopant uniformity on MOSFET threshold voltage variability Solid-State Electronics 69,62-66頁 (共著) 2012/03
論文	Study on Device Matrix Array Structure for MOSFET gm Variability Evaluation Proc. Int. Conf. on Microelectronic Test Structures,73-76頁 (共著) 2012/03
論文	gm Variability Caused by Local Threshold-Voltage Fluctuation Proc. IEEE Workshop on Variability Modeling and Characterization at ICCAD,P1 (共著) 2011/11
論文	Effect of the Channel Dopant Non-Uniformity on VTH-Variation Proc. IEEE Workshop on Variability Modeling and Characterization at ICCAD,P4 (共著) 2010/11
論文	MOSFET-Array for Extracting Parameters Expressing SPICE-Parameter Variation Proc. Int. Conf. on Microelectronic Test Structures,76-79頁 (共著) 2010/03
論文	Measurement of MOSFET Drain Current Variation Under High Gate Voltage Solid State Electronics 53,314-319頁 (共著) 2009/03
論文	Extraction of effective LDMOSFET channel length and its application to the modeling Proc. Int. Conf. on Microelectronic Test Structures,81-84頁 (共著) 2000/03
論文	オフセットゲートMOSFETの回路モデル電子情報通信学会論文誌 J-82-C-II,527-530頁 (共著) 1999/09
論文	Extraction of off-set region length for off-set gate MOSFETs Solid-State Electronics 43,97-102頁 (共著) 1999/01
論文	Measurement of channel length and off-set region length for off-set gate MOSFETs Proc. 27th European Solid State Device Research Conference,652-655頁 (共著) 1997/09
論文	Theoretical Study of Resonant Tunneling in Symmetrical Rectangular Triple-Barrier Structures with Deep Wells Materials Sciences & Engineering B 35,421-428頁 (共著) 1995/12
論文	Resonant Tunneling and Confining Phenomena in Symmetrical Rectangular Triple-Barrier Structures with C-type Double Wells Phys. Stat. Sol. (b) 188,679-688頁 (共著) 1995/04
論文	Resonant Tunneling and Confining Phenomena in Symmetrical Rectangular Triple-Barrier Structures with C-type Deep Wells Superlattices and Microstructures 17,35-39頁 (共著) 1995/01